With the increasing demands on system performance, production quality as well as economic operation, modern industrial systems and processes are becoming more and more complicated. The analytical model from the first principals may either extremely hard to obtain in practice or could contain large uncertainties. As a result, to control, monitor as well fault diagnosis of such complex processes is posing a great challenge due to the possible unavailability of sufficient quantitative knowledge about the process. In contrast to traditional model-based approaches, data-driven control, monitoring and fault accommodation make use of the information obtained from the available process measurements to describe various complex behaviors, and thus have formed an efficient alternative for control and monitoring issues with complex industrial applications.
The IES “Data-driven control and monitoring” technical committee aims to provide a forum for researchers and practitioners to exchange their latest achievements and to identify critical issues and challenges for future investigation on control, monitoring, fault diagnosis and optimization with complex industrial applications.
In this Web page you can find information about the activities being developed by the Technical Committee. If you wish to be involved in these activities, please send an email message to shen.yin2011(at)googlemail.com.